報告簡介:基于深層瞬態光譜學的Al/Ti 4H-SiC肖特基結構缺陷研究 Investigation of Defect Levels of Al/Ti 4H-SiC Schottky Structures byDeep Level Transient Spectroscopy何亞偉 中國科學院半導體研究所 HE Yawei Institute of Semiconductors, Chinese Academy of Sciences
基于MOVPE技術生長GaN表面的原位相干X射線研究 In situ coherent x-ray studies of surface dynamics during OMVPE of GaN鞠光旭美國亞利桑那州立大學助理教授 GuangxuJUAssistant Research Professor of Arizona State University, USA